The Impact of Information Richness on Fault Localization. - Yan Lei; Min Zhang; Bixin Li; Jingan Ren; Yinhua Jiang (IEICE Trans. Inf. Syst., 2016)

Toward Understanding Information Models of Fault Localization: Elaborate is Not Always Better. - Yan Lei; Xiaoguang Mao; Min Zhang; Jingan Ren; Yinhua Jiang (COMPSAC (1), 2017)