360Anywhere: Mobile Ad-hoc Collaboration in Any Environment using 360 Video and Augmented Reality. - Maximilian Speicher; Jingchen Cao; Ao Yu; Haihua Zhang; Michael Nebeling (Proc. ACM Hum. Comput. Interact., 2018)

Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies. - Jingchen Cao; Lyuan Xu; Bharat L. Bhuva; Shi-Jie Wen; Richard Wong; Balaji Narasimham; Lloyd W. Massengill (IRPS, 2019)

Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology. - Lyuan Xu; Jingchen Cao; Bharat L. Bhuva; Indranil Chatterjee; Shi-Jie Wen; Richard Wong; Lloyd W. Massengill (IRPS, 2019)

Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET Technology. - Jingchen Cao; Lyuan Xu; Shi-Jie Wen; Rita Fung; Balaji Narasimham; Lloyd W. Massengill; Bharat L. Bhuva (IRPS, 2020)

Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node. - Lyuan Xu; Jingchen Cao; John Brockman; Carlo Cazzaniga; Christopher Frost 002; Shi-Jie Wen; Rita Fung; Bharat L. Bhuva (IRPS, 2020)

High-Current State triggered by Operating-Frequency Change. - Lyuan Xu; Jingchen Cao; Shi-Jie Wen; Rita Fung; Jamie Markevitch; Dennis R. Ball; Bharat L. Bhuva (IRPS, 2020)