基于卷积去噪自编码器的芯片表面弱缺陷检测方法 (Detection Method of Chip Surface Weak Defect Based on Convolution Denoising Auto-encoders). - Yuetong Luo; Jingshuai Bian; Meng Zhang; Yongming Rao; Feng Yan (计算机科学, 2020)