A 0.02% Accuracy Loss Voltage-Mode Parallel Sensing Scheme for RRAM-Based XNOR-Net Application. - Yulin Zhao; Jie Yu 027; Donglin Zhang; Qiao Hu; Xuanzhi Liu; Haijun Jiang; Qingting Ding; Zhongze Han; Jinhui Cheng; Wenjun Zhang; Yue Cao; Ruixi Zhou; et al. (IEEE Trans. Circuits Syst. II Express Briefs, 2022)

A Hf0.5Zr0.5O2 ferroelectric capacitor-based half-destructive read scheme for computing-in-memory. - Yulin Zhao; Yuan Wang; Donglin Zhang; Zhongze Han; Qiao Hu; Xuanzhi Liu; Qingting Ding; Jinhui Cheng; Wenjun Zhang; Yue Cao; Ruixi Zhou; Qing Luo; et al. (Sci. China Inf. Sci., 2023)

Advanced Integration-Inspired Process-in-Memory: A Comprehensive Review of Design, Challenges, and Future Prospects. - Jinhui Cheng; Zhaoliang Guan; Jiangduo Fu; Hangyu Xu; Jinkun Ke (IEEE Access, 2024)

A stimulus identification method for high-resolution ADC linearity testing using low-precision ramp signals. - Jiangduo Fu; Zhaoliang Guan; Jinhui Cheng; Hangyu Xu; Jinkun Ke (IEICE Electron. Express, 2024)