dinsEditor: A Browser Extension for QTI-Compliant Assessment Item Authoring. - Sungjae Han; Jinjoo Kim; Youngseok Lee 001; Jaehyuk Cha; Byung-Uk Choi (ICALT, 2010)

Systematical study of 14nm FinFET reliability: From device level stress to product HTOL. - Changze Liu; Hyun-Chul Sagong; Hyejin Kim; Seungjin Choo; Hyunwoo Lee; Yoohwan Kim; Hyunjin Kim; Bisung Jo; Minjung Jin; Jinjoo Kim; Sangsu Ha; Sangwoo Pae; et al. (IRPS, 2015)