Low Power Test Data Compression Based on LFSR Reseeding. - Jinkyu Lee 005; Nur A. Touba (ICCD, 2004)

Low Power BIST Based on Scan Partitioning. - Jinkyu Lee 005; Nur A. Touba (DFT, 2005)

Efficiently Utilizing ATE Vector Repeat for Compression by Scan Vector Decomposition. - Jinkyu Lee 005; Nur A. Touba (ATS, 2006)

Combining Linear and Non-Linear Test Vector Compression Using Correlation-Based Rectangular Encoding. - Jinkyu Lee 005; Nur A. Touba (VTS, 2006)

LFSR-Reseeding Scheme Achieving Low-Power Dissipation During Test. - Jinkyu Lee 005; Nur A. Touba (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2007)

Correlation-Based Rectangular Encoding. - Jinkyu Lee 005; Nur A. Touba (IEEE Trans. Very Large Scale Integr. Syst., 2010)

Utilizing ATE Vector Repeat With Linear Decompressor for Test Vector Compression. - Joon-Sung Yang; Jinkyu Lee 005; Nur A. Touba (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014)