Broadband Characterization of Thin Dielectrics Using Heterolayer and Monolayer MIM Capacitors. - Yunsang Shin; Seung-Geol Nam; Jinseong Heo; Sangwook Nam (IEEE Trans. Instrum. Meas., 2022)

Parallel synaptic design of ferroelectric tunnel junctions for neuromorphic computing. - Taehwan Moon; Hyun Jae Lee; Seung-Geol Nam; Hagyoul Bae; Duk-Hyun Choe; Sanghyun Jo; Yunseong Lee; Yoonsang Park; J. Joshua Yang; Jinseong Heo (Neuromorph. Comput. Eng., 2023)

Drain Current Degradation Induced by Charge Trapping/De-Trapping in Fe-FET. - Taeyoung Kim; Suhwan Lim; Ilho Myeong; Sanghyun Park; Suseong Noh; Seung Min Lee; Jongho Woo; Hanseung Ko; Youngji Noh; Moonkang Choi; Kiheun Lee; Sangwoo Han; et al. (IRPS, 2024)

A Comprehensive Study of Read-After-Write-Delay for Ferroelectric VNAND. - Ilho Myeong; Suhwan Lim; Taeyoung Kim; Sanghyun Park; Suseong Noh; Seung Min Lee; Jongho Woo; Hanseung Ko; Youngji Noh; Munkang Choi; Kiheun Lee; Sangwoo Han; et al. (IRPS, 2024)