Electrostatic discharge failure analysis of capacitive RF MEMS switches. - Jinyu Jason Ruan; Nicolas Nolhier; Marise Bafleur; Laurent Bary; Fabio Coccetti; T. Lisec; Robert Plana (Microelectron. Reliab., 2007)

Alpha particle radiation effects in RF MEMS capacitive switches. - Jinyu Jason Ruan; E. Papandreou; Mohamed Lamhamdi; Matroni Koutsoureli; Fabio Coccetti; Patrick Pons; George J. Papaioannou; Robert Plana (Microelectron. Reliab., 2008)

ESD failure signature in capacitive RF MEMS switches. - Jinyu Jason Ruan; George J. Papaioannou; Nicolas Nolhier; Nicolas Mauran; Marise Bafleur; Fabio Coccetti; Robert Plana (Microelectron. Reliab., 2008)

Accelerated lifetime test of RF-MEMS switches under ESD stress. - Jinyu Jason Ruan; Nicolas Nolhier; George J. Papaioannou; David Trémouilles; Vincent Puyal; C. Villeneuve; T. Idda; Fabio Coccetti; Robert Plana (Microelectron. Reliab., 2009)

Three-Dimensional RF MEMS Switch for Power Applications. - Joo-Young Choi; Jinyu Jason Ruan; Fabio Coccetti; Stepan Lucyszyn (IEEE Trans. Ind. Electron., 2009)

Analyse et modélisation de l'impact des décharges électrostatiques et des agressions électromagnétiques sur les microcommutateurs. - Jinyu Jason Ruan (2010)

An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices. - Jinyu Jason Ruan; Nicolas Monnereau; David Trémouilles; Nicolas Mauran; Fabio Coccetti; Nicolas Nolhier; Robert Plana (IEEE Trans. Instrum. Meas., 2012)