Detecting and classifying hidden defects in additively manufactured parts using deep learning and X-ray computed tomography. - Miles V. Bimrose; Tianxiang Hu; Davis J. McGregor; Jiongxin Wang; Sameh H. Tawfick; Chenhui Shao; Zuozhu Liu; William P. King (J. Intell. Manuf., 2025)

Correction: Detecting and classifying hidden defects in additively manufactured parts using deep learning and X-ray computed tomography. - Miles V. Bimrose; Tianxiang Hu; Davis J. McGregor; Jiongxin Wang; Sameh H. Tawfick; Chenhui Shao; Zuozhu Liu; William P. King (J. Intell. Manuf., 2025)