Test Patterns Compression Technique Based on a Dedicated SAT-Based ATPG. - Jiri Balcarek; Petr Fiser; Jan Schmidt (DSD, 2010)

The Influence of Implementation Technology on Dependability Parameters. - Jan Schmidt; Petr Fiser; Jiri Balcarek (DSD, 2012)

Simulation and SAT Based ATPG for Compressed Test Generation. - Jiri Balcarek; Petr Fiser; Jan Schmidt (DSD, 2013)

Techniques for SAT-based constrained test pattern generation. - Jiri Balcarek; Petr Fiser; Jan Schmidt (Microprocess. Microsystems, 2013)

The influence of implementation type on dependability parameters. - Jan Schmidt; Petr Fiser; Jiri Balcarek (Microprocess. Microsystems, 2013)

Sources of bias in EDA tools and its influence. - Petr Fiser; Jan Schmidt; Jiri Balcarek (DDECS, 2014)

PBO-Based Test Compression. - Jiri Balcarek; Petr Fiser; Jan Schmidt (DSD, 2014)

On Robustness of EDA Tools. - Jan Schmidt; Petr Fiser; Jiri Balcarek (DSD, 2014)

On don't cares in test compression. - Jirí Balcárek; Petr Fiser; Jan Schmidt (Microprocess. Microsystems, 2014)