On Using Deterministic Test Sets in BIST. - Ondrej Novák; Jiri Nosek (IOLTW, 2000)

Test Pattern Decompression Using a Scan Chain. - Ondrej Novák; Jiri Nosek (DFT, 2001)

Test-per-Clock Testing of the Circuits with Scan. - Ondrej Novák; Jiri Nosek (IOLTW, 2001)

Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor. - Ondrej Novák; Zdenek Plíva; Jiri Nosek; Andrzej Hlawiczka; Tomasz Garbolino; Krzysztof Gucwa (J. Electron. Test., 2004)