Fault Diagnosis of Analog Circuits Based on Adaptive Test and Output Characteristics. - Yukiya Miura; Jiro Kato (DFT, 2006)

Diagnosis of Analog Circuits by Using Multiple Transistors and Data Sampling. - Yukiya Miura; Jiro Kato (DFT, 2008)

Adaptive Fault Diagnosis of Analog Circuits by Operation-Region Model and X - Y Zoning Method. - Yukiya Miura; Jiro Kato (J. Electron. Test., 2008)