Analysis of hump effect in tensile-stressed a-IGZO TFT using TCAD simulation. - Yun-Yeong Choi; Ji-Sun Park 002; Hyung-Soon Shin (ICEIC, 2021)

Progressive Degradation Without Physical Failure During Mounting Due to Soft Overstress in Compound HBT for RF, Mobile, and Automotive Applications. - Hyeokjae Lee; Sanggi Ko; Ho-Joon Suh; Gina Jeong; Jung-Han Yeo; Hye-Min Park; Hee-Kyeong Kim; Jong-Kwan Kim; Sung S. Chung; Youngboo Kim; Jisun Park 002; Hyungsoon Shin (IRPS, 2022)

Deep Neural Networks for Determining Subgap States of Oxide Thin-Film Transistors. - Yun-Yeong Choi; Wookyung Sun; Jisun Park 002; Hyungsoon Shin (IEEE Access, 2023)

A Compact Integrate-and-Fire Neuron Circuit Embedding Operational Transconductance Amplifier for Fidelity Enhancement. - Arati Kumari Shah; Eou-Sik Cho; Jisun Park 002; Hyungsoon Shin; Seongjae Cho (IEEE Access, 2023)

An Area-Efficient Integrate-and-Fire Neuron Circuit with Enhanced Robustness against Synapse Variability in Hardware Neural Network. - Arati Kumari Shah; Kannan Udaya Mohanan; Jisun Park 002; Hyungsoon Shin; Eou-Sik Cho; Seongjae Cho (IET Circuits Devices Syst., 2023)