A cost-effective and highly robust triple-node-upset self-recoverable latch design based on dual-output C-elements. - Hui Xu; Lin Tang; Ruijun Ma; Huaguo Liang; Zhengfeng Huang; Tianming Ni; Jiuqi Li; Xiaodong Ai (Microelectron. J., 2024)

Highly Defect Detectable and SEU-Resilient Robust Scan-Test-Aware Latch Design. - Ruijun Ma; Stefan Holst; Hui Xu; Xiaoqing Wen; Senling Wang; Jiuqi Li; Aibin Yan (IEEE Trans. Very Large Scale Integr. Syst., 2025)