WDP-BNN: Efficient wafer defect pattern classification via binarized neural network. - Qing Zhang 008; Yuhang Zhang 008; Jizuo Li; Yongfu Li 002 (Integr., 2022)

Litho-NeuralODE 2.0: Improving hotspot detection accuracy with advanced data augmentation, DCT-based features, and neural ordinary differential equations. - Qing Zhang 008; Yuhang Zhang 008; Jizuo Li; Wei Lu; Yongfu Li 002 (Integr., 2022)

Corrigendum to "WDP-BNN: Efficient wafer defect pattern classification via binarized neural network" [Integration 85 (2022) 76-86]. - Qing Zhang 008; Yuhang Zhang 008; Jizuo Li; Yongfu Li 002 (Integr., 2023)

CmpCNN: CMP Modeling with Transfer Learning CNN Architecture. - Qing Zhang 008; Huajie Huang; Jizuo Li; Yuhang Zhang 008; Yongfu Li 002 (ACM Trans. Design Autom. Electr. Syst., 2023)