Defect-Oriented Test- and Layout-Generation for Standard-Cell ASIC Designs. - Joachim Sudbrock; Jaan Raik; Raimund Ubar; Wieslaw Kuzmicz; Witold A. Pleskacz (DSD, 2005)

DOT: new deterministic defect-oriented ATPG tool. - Jaan Raik; Raimund Ubar; Joachim Sudbrock; Wieslaw Kuzmicz; Witold A. Pleskacz (ETS, 2005)