Determination of Silicon Film Thickness in SOI Capacitors. - Victor Sonnenberg; João Antonio Martino (LATW, 2000)

Analog Circuit Design Using Graded-Channel SOI NMOSFETS. - Marcelo Antonio Pavanello; João Antonio Martino; Denis Flandre (SBCCI, 2001)

Design of Operational Transconductance Amplifiers with Improved Gain by Using Graded-Channel SOI nMOSFETs. - Salvador Pinillos Gimenez; Marcelo Antonio Pavanello; João Antonio Martino; Stephane Adriaensen; Denis Flandre (SBCCI, 2003)

Impact of the twin-gate structure on the linear kink effect in PD SOI nMOSFETS. - Paula Ghedini Der Agopian; João Antonio Martino; Eddy Simoen; Cor Claeys (Microelectron. J., 2006)

The temperature mobility degradation influence on the zero temperature coefficient of partially and fully depleted SOI MOSFETs. - L. M. Camillo; João Antonio Martino; Eddy Simoen; Cor Claeys (Microelectron. J., 2006)

Evaluation of graded-channel SOI MOSFET operation at high temperatures. - Milene Galeti; Marcelo Antonio Pavanello; João Antonio Martino (Microelectron. J., 2006)

Gain improvement in operational transconductance amplifiers using Graded-Channel SOI nMOSFETS. - Salvador Pinillos Gimenez; Marcelo Antonio Pavanello; João Antonio Martino; Denis Flandre (Microelectron. J., 2006)

Cryogenic operation of graded-channel silicon-on-insulator nMOSFETs for high performance analog applications. - Marcelo Antonio Pavanello; Paula Ghedini Der Agopian; João Antonio Martino; Denis Flandre (Microelectron. J., 2006)

Study of the linear kink effect in PD SOI nMOSFETs. - Paula Ghedini Der Agopian; João Antonio Martino; Eddy Simoen; Cor Claeys (Microelectron. J., 2007)

An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devices. - Renan Trevisoli Doria; João Antonio Martino; Eddy Simoen; Cor Claeys; Marcelo Antonio Pavanello (Microelectron. Reliab., 2012)

Investigation of Bulk and DTMOS triple-gate devices under 60 MeV proton irradiation. - Maria Glória Caño de Andrade; João Antonio Martino; Marc Aoulaiche; Nadine Collaert; Eddy Simoen; Cor Claeys (Microelectron. Reliab., 2014)

Performance evaluation of Tunnel-FET basic amplifier circuits. - R. S. Rangel; Paula Ghedini Der Agopian; João Antonio Martino (LASCAS, 2019)

Tradeoff between the transistor reconfigurable technology and the zero-temperature-coefficient (ZTC) bias point on BESOI MOSFET. - Katia Regina Akemi Sasaki; Ricardo C. Rangel; Leonardo S. Yojo; João Antonio Martino (Microelectron. J., 2019)

Analysis of zero-temperature coefficient behavior on vertically stacked double nanosheet nMOS devices. - Carlos H. S. Coelho; João Antonio Martino; Marcello Bellodi; Eddy Simoen; Anabela Veloso; Paula Ghedini Der Agopian (Microelectron. J., 2021)