Harmonic distortion analysis using an improved charge sheet model for PD SOI MOSFETs. - Joaquín Alvarado; Antonio Cerdeira; Valeria Kilchytska; Denis Flandre (Microelectron. J., 2007)

Compact model for single event transients and total dose effects at high temperatures for partially depleted SOI MOSFETs. - Joaquín Alvarado; El Hafed Boufouss; Valeria Kilchytska; Denis Flandre (Microelectron. Reliab., 2010)

Characterization and modelling of single event transients in LDMOS-SOI FETs. - Joaquín Alvarado; Valeria Kilchytska; El Hafed Boufouss; Denis Flandre (Microelectron. Reliab., 2011)

Impact of neutron irradiation on the RF properties of oxidized high-resistivity silicon substrates with and without a trap-rich passivation layer. - C. Roda Neve; Valeria Kilchytska; Joaquín Alvarado; Dimitri Lederer; O. Militaru; Denis Flandre; Jean-Pierre Raskin (Microelectron. Reliab., 2011)

High-energy neutrons effect on strained and non-strained SOI MuGFETs and planar MOSFETs. - Valeria Kilchytska; Joaquín Alvarado; S. Put; Nadine Collaert; Eddy Simoen; Cor Claeys; Otilia Militaru; Guy Berger; Denis Flandre (Microelectron. Reliab., 2012)

Implementation of nanoscale double-gate CMOS circuits using compact advanced transport models. - Muthupandian Cheralathan; Esteban Contreras; Joaquín Alvarado; Antonio Cerdeira; Giuseppe Iannaccone; Enrico Sangiorgi; Benjamín Iñíguez (Microelectron. J., 2013)