A new methodology for improved tester utilization. - Ajay Khoche; Rohit Kapur; David Armstrong; Thomas W. Williams; Mick Tegethoff; Jochen Rivoir (ITC, 2001)

Tackling test trade-offs from design, manufacturing to market using economic modeling. - Erik H. Volkerink; Ajay Khoche; Linda A. Kamas; Jochen Rivoir; Hans G. Kerkhoff (ITC, 2001)

Test Vector Compression Using EDA-ATE Synergies. - Ajay Khoche; Erik H. Volkerink; Jochen Rivoir; Subhasish Mitra (VTS, 2002)

Test Economics for Multi-site Test with Modern Cost Reduction Techniques. - Erik H. Volkerink; Ajay Khoche; Jochen Rivoir; Klaus-Dieter Hilliges (VTS, 2002)

Lowering Cost of Test: Parallel Test or Low-Cost ATE? - Jochen Rivoir (Asian Test Symposium, 2003)

Modern Test Techniques: Tradeoffs, Synergies, and Scalable Benefits. - Erik H. Volkerink; Ajay Khoche; Jochen Rivoir; Klaus-Dieter Hilliges (J. Electron. Test., 2003)

Low-Cost Analog Signal Generation Using a Pulse-Density Modulated Digital ATE Channel. - Jochen Rivoir (Asian Test Symposium, 2004)

Statistical Linearity Calibration of Time-To-Digital Converters Using a Free-Running Ring Oscillator. - Jochen Rivoir (ATS, 2006)

Fully-Digital Time-To-Digital Converter for ATE with Autonomous Calibration. - Jochen Rivoir (ITC, 2006)

Special Session: Analog Production Test. - Fidel Muradali; Jochen Rivoir (ATS, 2007)

Fast and Low Cost HW Bit Map for Memory Test Based on Residue Polynomial System over GF(2). - Jochen Rivoir (ATS, 2007)

Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals Using Digital ATE. - Nicolas Pous; Florence Azaïs; Laurent Latorre; Pascal Nouet; Jochen Rivoir (Asian Test Symposium, 2009)

On the use of standard digital ATE for the analysis of RF signals. - Nicolas Pous; Florence Azaïs; Laurent Latorre; Jochen Rivoir (ETS, 2010)

Experiments on the analysis of phase/frequency-modulated RF signals using digital tester channels. - Nicolas Pous; Florence Azaïs; Laurent Latorre; Pascal Nouet; Jochen Rivoir (LATW, 2010)

A Level-Crossing Approach for the Analysis of RF Modulated Signals Using Only Digital Test Resources. - Nicolas Pous; Florence Azaïs; Laurent Latorre; Jochen Rivoir (J. Electron. Test., 2011)

Efficient generation of parametric test conditions for AMS chips with an interval constraint solver. - Felix Neubauer; Jan Burchard; Pascal Raiola; Jochen Rivoir; Bernd Becker 001; Matthias Sauer 002 (VTS, 2018)

IP Session on Machine Learning Applications in IC Test-Related Tasks. - Ghada Sokar; Yassin Zakaria; Asmaa Rabie; Kareem Madkour; Ira Leventhal; Jochen Rivoir; Xinli Gu; Haralampos-G. D. Stratigopoulos (VTS, 2019)

ORSA: Outlier Robust Stacked Aggregation for Best- and Worst-Case Approximations of Ensemble Systems. - Peter Domanski; Dirk Pflüger; Raphaël Latty; Jochen Rivoir (ICMLA, 2021)

Self-Learning Tuning for Post-Silicon Validation. - Peter Domanski; Dirk Pflüger; Jochen Rivoir; Raphaël Latty (CoRR, 2021)

Intelligent Methods for Test and Reliability. - Hussam Amrouch; Jens Anders; Steffen Becker 001; Maik Betka; Gerd Bleher; Peter Domanski; Nourhan Elhamawy; Thomas Ertl; Athanasios Gatzastras; Paul R. Genssler; Sebastian Hasler; Martin Heinrich; et al. (DATE, 2022)

A Deep-Learning-Aided Pipeline for Efficient Post-Silicon Tuning. - Yiwen Liao; Bin Yang 009; Raphaël Latty; Jochen Rivoir (CoRR, 2022)

Deep Feature Selection Using a Novel Complementary Feature Mask. - Yiwen Liao; Jochen Rivoir; Raphaël Latty; Bin Yang 009 (CoRR, 2022)