An accurate and scalable MOSFET aging model for circuit simulation. - Bogdan Tudor; Joddy Wang; Zhaoping Chen; Robin Tan; Weidong Liu; Frank Lee 003 (ISQED, 2011)

An accurate MOSFET aging model for 28 nm integrated circuit simulation. - Bogdan Tudor; Joddy Wang; Zhaoping Chen; Robin Tan; Weidong Liu; Frank Lee 003 (Microelectron. Reliab., 2012)

Advanced Reliability-Aware Verification for Robust Circuit Design. - Joddy Wang; Frank Lee 003 (ASICON, 2019)

OMI/TMI-based Modeling and Fast Simulation of Random Telegraph Noise (RTN) in Advanced Logic Devices and Circuits. - Runsheng Wang; Zhe Zhang 006; Shaofeng Guo; Qingxue Wang; Dehuang Wu; Joddy Wang; Ru Huang 001 (ASICON, 2019)

Advanced Circuit Reliability Verification for Robust Design. - Antony Fan; Joddy Wang; Vladimir Aptekar (IRPS, 2019)

New-Generation Design-Technology Co-Optimization (DTCO): Machine-Learning Assisted Modeling Framework. - Zhe Zhang 006; Runsheng Wang; Cheng Chen; Qianqian Huang; Yangyuan Wang; Cheng Hu; Dehuang Wu; Joddy Wang; Ru Huang 001 (CoRR, 2019)