The MC68332 microcontroller. - Joe Jelemensky; Vernon Goler; Brad Burgess; James Eifert; Gary Miller; Leslie Kohn; Neal Margulis (IEEE Micro, 1989)

Soft-defect detection (SDD) technique for a high-reliability CMOS SRAM. - Clinton Kuo; Thomas Toms; Bruce T. Neel; Joe Jelemensky; Ernest A. Carter; Philip Smith (IEEE J. Solid State Circuits, 1990)