ATPG in practical and non-traditional applications. - Brion L. Keller; Kevin McCauley; Joseph Swenton; James Youngs (ITC, 1998)

A Simplified Method for Testing the IBM Pipeline Partial-Scan Microprocessor. - Xinghao Chen 004; Thomas J. Snethen; Joe Swenton; Ron Walther (Asian Test Symposium, 1999)

Design and implementation of a parallel automatic test pattern generation algorithm with low test vector count. - Robert Butler; Brion L. Keller; Sarala Paliwal; Richard Schoonover; Joseph Swenton (ITC, 2000)

A Novel Failure Diagnosis Approach for Low Pin Count and Low Power Compression Architectures. - Sameer Chillarige; S. Virdi; Anil Malik; Krishna Chakravadhanula; Vivek Chickermane; Joe Swenton; G. Vandling (NATW, 2015)

High throughput multiple device diagnosis system. - Sameer Chillarige; Anil Malik; Sharjinder Singh; Joe Swenton; Krishna Chakravadhanula (ITC, 2017)

Improving Diagnosis Resolution and Performance at High Compression Ratios. - Sameer Chillarige; Atul Chhabra; Anil Malik; Bharath Nandakumar; Joe Swenton; Krishna Chakravadhanula (ITC, 2018)

Optimization of Cell-Aware ATPG Results by Manipulating Library Cells' Defect Detection Matrices. - Zhan Gao; Min-Chun Hu 002; Joe Swenton; Santosh Malagi; Jos Huisken; Kees Goossens; Erik Jan Marinissen (ITC-Asia, 2019)

Application of Cell-Aware Test on an Advanced 3nm CMOS Technology Library. - Zhan Gao; Santosh Malagi; Min-Chun Hu 002; Joe Swenton; Rogier Baert; Jos Huisken; Bilal Chehab; Kees Goossens; Erik Jan Marinissen (ITC, 2019)

Defect-Location Identification for Cell-Aware Test. - Zhan Gao; Santosh Malagi; Erik Jan Marinissen; Joe Swenton; Jos Huisken; Kees Goossens (LATS, 2019)

Tightening the Mesh Size of the Cell-Aware ATPG Net for Catching All Detectable Weakest Faults. - Min-Chun Hu 002; Zhan Gao; Santosh Malagi; Joe Swenton; Jos Huisken; Kees Goossens; Cheng-Wen Wu; Erik Jan Marinissen (ETS, 2020)

Speeding up Cell-Aware Library Characterization by Preceding Simulation with Structural Analysis. - Francesco Lorenzelli; Zhan Gao; Joe Swenton; Santosh Malagi; Erik Jan Marinissen (ETS, 2021)

Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality. - Zhan Gao; Min-Chun Hu 002; Santosh Malagi; Joe Swenton; Jos Huisken; Kees Goossens; Erik Jan Marinissen (J. Electron. Test., 2021)

Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology. - Zhan Gao; Min-Chun Hu 002; Rogier Baert; Bilal Chehab; Joe Swenton; Santosh Malagi; Jos Huisken; Kees Goossens; Erik Jan Marinissen (IEEE Des. Test, 2024)