Modeling and predictive control of a rotating disk bioreactor. - Matthew Kuure-Kinsey; Dale Weber; Henry R. Bungay; Joel L. Plawsky; B. Wayne Bequette (ACC, 2005)

A moisture-related breakdown mechanism in low-k dielectrics using a multiple I-V ramp test. - Sean P. Ogden; Juan Borja; Huawei Zhou; Joel L. Plawsky; Toh-Ming Lu; William N. Gill (IRPS, 2015)

Charge transport model to predict dielectric breakdown as a function of voltage, temperature, and thickness. - Sean P. Ogden; Yueming Xu; Kong Boon Yeap; Tian Shen; Toh-Ming Lu; Joel L. Plawsky (Microelectron. Reliab., 2018)