Case study: effectiveness of high-speed scan based feed forward voltage testing in reducing DPPM on a high volume ASIC. - Joel Lurkins; DeAnna Hill; Brady Benware (ITC, 2005)

Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. - Ritesh P. Turakhia; W. Robert Daasch; Joel Lurkins; Brady Benware (IEEE Des. Test Comput., 2006)