Concurrent Test Scheduling in Built-In Self-Test Environment. - Chien-In Henry Chen; Joel T. Yuen (ICCD, 1992)

Autonomous-Tol for Hardware Partitioning in a Built-in Self-Test Environment. - Chien-In Henry Chen; Joel T. Yuen; Ji-Der Lee (ICCD, 1992)

Logic partitioning to pseudo-exhaustive test for BIST design. - Chien-In Henry Chen; Joel T. Yuen (ICCAD, 1993)

Automated synthesis of pseudo-exhaustive test generator in VLSI BIST design. - Chien-In Henry Chen; Joel T. Yuen (IEEE Trans. Very Large Scale Integr. Syst., 1994)