Some Visual Inspection Problems in the Belgian Industry (Invited). - Patrick Wambacq; Piet Dewaele; Rudi Bartels; Johan Vandeneede; Dirk Van Den Oudenhoven; André Oosterlinck (MVA, 1988)

Similarity extraction and modeling. - Luc Van Gool; Johan Wagemans; Johan Vandeneede; André Oosterlinck (ICCV, 1990)