A general purpose design-for-test methodology at the analog-digital boundary of mixed-signal VLSI. - Johan Verfaillie; Didier Haspeslagh (J. Electron. Test., 1996)

A highly linear CMOS Gm-C bandpass filter with on-chip frequency tuning. - Zhong Yuan Chang; Didier Haspeslagh; Johan Verfaillie (IEEE J. Solid State Circuits, 1997)

Application of Supply Current Testing to Analogue Circuits, Towards a Structural Analogue Test Methodology. - Hans A. R. Manhaeve; Johan Verfaillie; B. Straka; J. P. Cornil (J. Electron. Test., 2000)

Debug architecture for system on chip taking full advantage of the test access port. - Erik Moerman; Sébastien Bocq; Johan Verfaillie (ETW, 2003)