Impact of Bi-Layer Gate Stack and Thickness on Low Frequency TDDB in FinFET and Planar Devices. - Kartika Chandra Sahoo; Rakesh Ranjan; Ki-Don Lee; Junehwan Jonathan Kim; Robert Moeller; Pavitra Ramadevi Perepa; John A. Frerich; Ju Kwang Kim; Dung Dau; Mukyeng Jung (IRPS, 2025)