Where is the Xerox Corporation of the LIS Sector? - Alan Gilchrist; John Brockman (Libr. Trends, 1996)

SIGDOC reminiscences. - John Brockman (ACM J. Comput. Documentation, 2001)

Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node. - Lyuan Xu; Jingchen Cao; John Brockman; Carlo Cazzaniga; Christopher Frost 002; Shi-Jie Wen; Rita Fung; Bharat L. Bhuva (IRPS, 2020)

Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment. - Yoni Xiong; Alexandra Feeley; Nicholas J. Pieper; Dennis R. Ball; Balaji Narasimham; John Brockman; N. A. Dodds; S. A. Wender; Shi-Jie Wen; Rita Fung; Bharat L. Bhuva (IRPS, 2022)