Analysis and experimental verification of digital substrate noise generation for epi-type substrates. - Marc van Heijningen; John Compiet; Piet Wambacq; Stéphane Donnay; Marc Engels; Ivo Bolsens (IEEE J. Solid State Circuits, 2000)

Methodology and experimental verification for substrate noise reduction in CMOS mixed-signal ICs with synchronous digital circuits. - Mustafa Badaroglu; Marc van Heijningen; Vincent Gravot; John Compiet; Stéphane Donnay; Georges G. E. Gielen; Hugo J. De Man (IEEE J. Solid State Circuits, 2002)