Importance of dynamic faults for new SRAM technologies. - Said Hamdioui; Rob Wadsworth; John Delos Reyes; Ad J. van de Goor (ETW, 2003)

Evaluation of Intra-Word Faults in Word-Oriented RAMs. - Said Hamdioui; John Delos Reyes; Zaid Al-Ars (Asian Test Symposium, 2004)

Memory Fault Modeling Trends: A Case Study. - Said Hamdioui; Rob Wadsworth; John Delos Reyes; Ad J. van de Goor (J. Electron. Test., 2004)