Structure and Metrology for an Analog Testability Bus. - Kenneth P. Parker; John E. McDermid; Stig Oresjo (ITC, 1993)

Design, Fabrications and Use of Mixed-Signal IC Testability Structures. - Kenneth P. Parker; John E. McDermid; Rodney A. Browen; Kozo Nuriya; Katsuhiro Hirayama; Akira Matsuzawa (ITC, 1997)

Will 0.1um Digital Circuits Require Mixed-Signal Testing. - Melvin A. Breuer; Bozena Kaminska; John E. McDermid; V. Rayapathi; Donald L. Wheater (VTS, 1997)

Limited access testing: IEEE 1149.4-instrumentation and methods. - John E. McDermid (ITC, 1998)