BIST controlled variable sense amp timing for 90nm embedded SRAM. - Ciaran J. Brennan; Steven Eustis; John Goss; A. Humphrey; Michael Ouellette; Jeremy Rowland; Michael Fragano (CICC, 2004)

Use of scalable Parametric Measurement Macro to improve semiconductor technology characterization and product test. - Jeanne Bickford; Nazmul Habib; John Goss; Robert McMahon; Rajiv V. Joshi; Rouwaida Kanj (ISQED, 2010)

Tail-Bit Tracking circuit with degraded VGS bit-cell mimic array for a 50% search-time and 200mV Vmin improvement in a Ternary Content Addressable Memory. - Igor Arsovski; Travis Hebig; John Goss; Paul Grzymkowski; Josh Patch (CICC, 2013)

12.4 1.4Gsearch/s 2Mb/mm2 TCAM using two-phase-precharge ML sensing and power-grid preconditioning to reduce Ldi/dt power-supply noise by 50%. - Igor Arsovski; Michael Fragano; Robert M. Houle; Akhilesh Patil; Van Butler; Raymond Kim; Ramon Rodriguez; Tom Maffitt; Joseph J. Oler; John Goss; Christopher Parkinson; Michael A. Ziegerhofer; et al. (ISSCC, 2017)