Ramping New IC Products in the Deep Submicron Age. - John Kibarian (ISQED, 2000)

Nanometer design: what hurts next...? - Robert W. Brodersen; Anthony M. Hill; John Kibarian; Desmond Kirkpatrick; Mark A. Lavin; Mitsumasa Koyanagi (DAC, 2002)

When IC yield missed the target, who is at fault? - Andreas J. Strojwas; Michael Campbell; Vassilios Gerousis; Jim Hogan; John Kibarian; Marc Levitt; Walter Ng; Dipu Pramanik; Mark Templeton (DAC, 2004)

Enabling True Design for Manufacturability. - John Kibarian (ISQED, 2005)

Guest Editors' Introduction: DFM Drives Changes in Design Flow. - Juan Antonio Carballo; Yervant Zorian; Raul Camposano; Andrzej J. Strojwas; John Kibarian; Dennis Wassung; Alex Alexanian; Steve Wigley; Neil Kelly (IEEE Des. Test Comput., 2005)