Impact of Negative Bias Temperature Instability on Product Parametric Drift. - Vijay Reddy; John M. Carulli; Anand T. Krishnan; William Bosch; Brendan Burgess (ITC, 2004)

Test connections - tying application to process. - John M. Carulli Jr.; Thomas J. Anderson (ITC, 2005)

The Impact of Multiple Failure Modes on Estimating Product Field Reliability. - John M. Carulli Jr.; Thomas J. Anderson (IEEE Des. Test Comput., 2006)

Modeling Test Escape Rate as a Function of Multiple Coverages. - Kenneth M. Butler; John M. Carulli Jr.; Jayashree Saxena (ITC, 2008)

Quality improvement and cost reduction using statistical outlier methods. - Amit Nahar; Kenneth M. Butler; John M. Carulli Jr.; Charles Weinberger (ICCD, 2009)

Multidimensional Test Escape Rate Modeling. - Kenneth M. Butler; John M. Carulli Jr.; Jayashree Saxena; Amit Nahar; W. Robert Daasch (IEEE Des. Test Comput., 2009)

Adapting to adaptive testing. - Erik Jan Marinissen; Adit D. Singh; Dan Glotter; Marco Esposito; John M. Carulli Jr.; Amit Nahar; Kenneth M. Butler; Davide Appello; Chris Portelli (DATE, 2010)

Die-level adaptive test: Real-time test reordering and elimination. - Kapil R. Gotkhindikar; W. Robert Daasch; Kenneth M. Butler; John M. Carulli Jr.; Amit Nahar (ITC, 2011)

Parametric counterfeit IC detection via Support Vector Machines. - Ke Huang 001; John M. Carulli Jr.; Yiorgos Makris (DFT, 2012)

Spatial correlation modeling for probe test cost reduction in RF devices. - Nathan Kupp; Ke Huang 001; John M. Carulli Jr.; Yiorgos Makris (ICCAD, 2012)

Spatial estimation of wafer measurement parameters using Gaussian process models. - Nathan Kupp; Ke Huang 001; John M. Carulli Jr.; Yiorgos Makris (ITC, 2012)

Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests. - Ke Huang 001; Nathan Kupp; John M. Carulli Jr.; Yiorgos Makris (DATE, 2013)

On combining alternate test with spatial correlation modeling in analog/RF ICs. - Ke Huang 001; Nathan Kupp; John M. Carulli Jr.; Yiorgos Makris (ETS, 2013)

Performance entitlement by exploiting transistor's BTI recovery. - Senthil Arasu; Mehrdad Nourani; Vijay Reddy; John M. Carulli (ISQED, 2013)

A design-for-reliability approach based on grading library cells for aging effects. - Senthil Arasu; Mehrdad Nourani; John M. Carulli; Kenneth M. Butler; Vijay Reddy (ITC, 2013)

Test data analytics - Exploring spatial and test-item correlations in production test data. - Chun-Kai Hsu; Fan Lin; Kwang-Ting Cheng; Wangyang Zhang; Xin Li 001; John M. Carulli; Kenneth M. Butler (ITC, 2013)

Counterfeit electronics: A rising threat in the semiconductor manufacturing industry. - Ke Huang 001; John M. Carulli; Yiorgos Makris (ITC, 2013)

Process monitoring through wafer-level spatial variation decomposition. - Ke Huang 001; Nathan Kupp; John M. Carulli Jr.; Yiorgos Makris (ITC, 2013)

Predicting die-level process variations from wafer test data for analog devices: A feasibility study. - Shyam Kumar Devarakond; Jennifer McCoy; Amit Nahar; John M. Carulli Jr.; Soumendu Bhattacharya; Abhijit Chatterjee (LATW, 2013)

Asymmetric aging of clock networks in power efficient designs. - Senthil Arasu; Mehrdad Nourani; Frank Cano; John M. Carulli; Vijay Reddy (ISQED, 2014)

Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation. - Ali Ahmadi; Ke Huang 001; Suriyaprakash Natarajan; John M. Carulli Jr.; Yiorgos Makris (ITC, 2014)

IC laser trimming speed-up through wafer-level spatial correlation modeling. - Constantinos Xanthopoulos; Ke Huang 001; Abbas Poonawala; Amit Nahar; Bob Orr; John M. Carulli Jr.; Yiorgos Makris (ITC, 2014)

Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling. - Shanghang Zhang; Xin Li 001; Ronald D. Blanton; José Machado da Silva; John M. Carulli Jr.; Kenneth M. Butler (ITC, 2014)

Innovative practices session 5C: Machine learning and data analysis in test. - Sounil Biswas; John M. Carulli; Dragoljub Gagi Drmanac; Arpan Bhattacherjee (VTS, 2014)

Special session 11B: ITRS adaptive test update. - John M. Carulli (VTS, 2014)

Reliability improvement of logic and clock paths in power-efficient designs. - Senthil Arasu; Mehrdad Nourani; Vijay Reddy; John M. Carulli Jr.; Gautam Kapila; Min Chen 024 (ACM J. Emerg. Technol. Comput. Syst., 2014)

Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain. - Ujjwal Guin; Ke Huang 001; Daniel DiMase; John M. Carulli; Mohammad Tehranipoor; Yiorgos Makris (Proc. IEEE, 2014)

A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits. - Hugo R. Gonçalves; Xin Li 001; Miguel V. Correia 002; Vítor Tavares; John M. Carulli Jr.; Kenneth M. Butler (DATE, 2015)

Yield prognosis for fab-to-fab product migration. - Ali Ahmadi; Ke Huang 001; Amit Nahar; Bob Orr; Michael Pas; John M. Carulli; Yiorgos Makris (VTS, 2015)

Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models. - Ke Huang 001; Nathan Kupp; Constantinos Xanthopoulos; John M. Carulli Jr.; Yiorgos Makris (IEEE Des. Test, 2015)

Recycled IC Detection Based on Statistical Methods. - Ke Huang 001; Yu Liu; Nenad Korolija; John M. Carulli; Yiorgos Makris (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015)

Variation and failure characterization through pattern classification of test data from multiple test stages. - Chun-Kai Hsu; Peter Sarson; Gregor Schatzberger; Friedrich Peter Leisenberger; John M. Carulli Jr.; Siddhartha Siddhartha; Kwang-Ting Cheng (ITC, 2016)

Pylon: Towards an integrated customizable volume diagnosis infrastructure. - Yan Pan; Rao Desineni; Kannan Sekar; Atul Chittora; Sherwin Fernandes; Neerja Bawaskar; John M. Carulli (ITC, 2016)

Consistency in wafer based outlier screening. - Sebastian Siatkowski; Chuanhe Jay Shan; Li-C. Wang; Nikolas Sumikawa; W. Robert Daasch; John M. Carulli (VTS, 2016)

Controlling Aging in Timing-Critical Paths. - Senthil Arasu; Mehrdad Nourani; John M. Carulli; Vijay Reddy (IEEE Des. Test, 2016)

Systematic defect detection methodology for volume diagnosis: A data mining perspective. - Chuanhe Jay Shan; Pietro Babighian; Yan Pan; John M. Carulli; Li-C. Wang (ITC, 2017)

Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations. - Ali Ahmadi; Haralampos-G. D. Stratigopoulos; Ke Huang 001; Amit Nahar; Bob Orr; Michael Pas; John M. Carulli; Yiorgos Makris (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017)

Generation and Quality Evaluation of Synthetic Process Control Monitoring Data. - Matthew Nigh; John M. Carulli; Yiorgos Makris (ITC, 2024)

Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond. - Ke Huang 001; Yu Liu; Nenad Korolija; John M. Carulli; Yiorgos Makris (IEEE Des. Test, 2024)

Enhancing Metrology to E-test Correlation Model Accuracy through Process Expertise Integration. - Ching-Yi Chang; Matthew Nigh; John M. Carulli; Yiorgos Makris (VTS, 2025)