Multi-GHz loopback testing using MEMs switches and SiGe logic. - David C. Keezer; Dany Minier; Patrice Ducharme; Doris Viens; Greg Flynn; John McKillop (ITC, 2007)

MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing. - David C. Keezer; Dany Minier; Patrice Ducharme; Doris Viens; Greg Flynn; John McKillop (VLSI Design, 2008)