An efficient and practical MOS statistical model for digital applications. - Qiang Zhang; Juin J. Liou; John McMacken; Kevin Stiles; J. Ross Thomson; Paul Layman (ISCAS, 2000)

SPICE modeling and quick estimation of MOSFET mismatch based on BSIM3 model and parametric tests. - Qiang Zhang; Juin J. Liou; John McMacken; J. Ross Thomson; Paul Layman (IEEE J. Solid State Circuits, 2001)

Statistical modeling of MOS devices for parametric yield prediction. - Juin J. Liou; Qiang Zhang; John McMacken; J. Ross Thomson; Kevin Stiles; Paul Layman (Microelectron. Reliab., 2002)