Machine Learning On Transistor Aging Data: Test Time Reduction and Modeling for Novel Devices. - Neel Chatterjee; John Ortega 002; Inanc Meric; Peng Xiao; Ilan Tsameret (IRPS, 2021)

Customized Parallel Reliability Testing Platform with Multifold Throughput Enhancement for Intel Stressing Tests. - Peng Xiao; Haris Hadziosmanovic; Michael Klessens; Rong Jiang; John Ortega 002; Daniel Schroeder; James Palmer 002; Ilan Tsameret (IRPS, 2021)