The forthcoming IEEE standard 1696 on test methods for characterizing circuit probes. - Nicholas G. Paulter; John R. Jendzurski; Mike McTigue; Bill Hagerup; Thomas Linnenbrink (I2MTC, 2013)

Overview of IEEE technical committee 41. - John R. Jendzurski (IEEE Instrum. Meas. Mag., 2020)

The documentary standards of the IEEE technical committee 10. - Sergio Rapuano; John R. Jendzurski; Luca De Vito; Steven J. Tilden; William B. Boyer; Nicholas G. Paulter (IEEE Instrum. Meas. Mag., 2020)

The IEEE Technical Committee 10: The Waveform Generation, Measurement, and Analysis Committee. - Luca De Vito; John R. Jendzurski; Sergio Rapuano; William B. Boyer; Jerome J. Blair; Nicholas G. Paulter (IEEE Instrum. Meas. Mag., 2021)

The IEEE Technical Committee 10-The Waveform Generation, Measurement, and Analysis Committee: Update 2021. - Luca De Vito; John R. Jendzurski; Sergio Rapuano; William B. Boyer; Jerome J. Blair; Nicholas G. Paulter (IEEE Instrum. Meas. Mag., 2022)

Technical Committee 10: Recent Progress. - John R. Jendzurski; Luca De Vito; Sergio Rapuano; William B. Boyer; Jerome J. Blair; Nicholas G. Paulter (IEEE Instrum. Meas. Mag., 2024)