Impact of negative bias temperature instability on digital circuit reliability. - Vijay Reddy; Anand T. Krishnan; Andrew Marshall; John Rodriguez; Sreedhar Natarajan; Tim Rost; Srikanth Krishnan (Microelectron. Reliab., 2005)

An implantable 64-channel neural interface with reconfigurable recording and stimulation. - Jesse J. Wheeler; Keith Baldwin; Alex Kindle; Daniel Guyon; Brian Nugent; Carlos Segura; John Rodriguez; Andrew Czarnecki; Hailey J. Dispirito; John Lachapelle; Philip D. Parks; James Moran; et al. (EMBC, 2015)

Pulsed Current-Voltage Protocol to Reveal Polarization-Continuation in Ferroelectric Memory: Implications for Partial State Storage. - Mir Muntasir Hossain; Pratyush Pandey; Akif Aabrar; Karla González-Serrano; Ted Moise; John Rodriguez; K. R. Udayakumar; Suman Datta; Alan C. Seabaugh (DRC, 2022)