Mitigating voltage droop during scan with variable shift frequency. - John Schulze; Ryan Tally (ITC, 2014)

Toward more efficient scan data bandwidth utilization on modern SOCs. - Yan Dong; Grady Giles; GuoLiang Li; Jeff Rearick; John Schulze; James Wingfield; Tim Wood 001 (SoCC, 2016)

Maximizing scan pin and bandwidth utilization with a scan routing fabric. - Yan Dong; Grady Giles; GuoLiang Li; Jeff Rearick; John Schulze; James Wingfield; Tim Wood 001 (ITC, 2017)

Global Control Signal Defect Diagnosis in Volume Production Environment. - Szczepan Urban; Piotr Zimnowlodzki; Manish Sharma; Shraddha Bodhe; John Schulze; Abdullah Yassine; Adam Styblinski (ITC, 2023)