Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring. - John T. Chen; Jitendra Khare; Ken Walker; Saghir A. Shaikh; Janusz Rajski; Wojciech Maly (ITC, 2001)

Enabling Embedded Memory Diagnosis via Test Response Compression. - John T. Chen; Wojciech Maly; Janusz Rajski; Omar Kebichi; Jitendra Khare (VTS, 2001)

Fault Tuples in Diagnosis of Deep-Submicron Circuits. - Ronald D. Blanton; John T. Chen; Rao Desineni; Kumar N. Dwarakanath; Wojciech Maly; Thomas J. Vogels (ITC, 2002)