Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. - Brady Benware; Cam Lu; John Van Slyke; Prabhu Krishnamurthy; Robert Madge; Martin Keim; Mark Kassab; Janusz Rajski (ITC, 2004)

Silicon evaluation of longest path avoidance testing for small delay defects. - Ritesh P. Turakhia; W. Robert Daasch; Mark Ward; John Van Slyke (ITC, 2007)