Reliability test methods for media-compatible pressure sensors. - Slobodan Petrovic; Adan Ramirez; Theresa Maudie; Dennis Stanerson; John Wertz; Gordon Bitko; Jeanene Matkin; David J. Monk (IEEE Trans. Ind. Electron., 1998)

Novel Deep Learning Image Registration Techniques with Application to Microscopy Images of Metal Alloys. - Nathan A. Johnston; Nathan B. Gaw; John Wertz; Bruce Cox; Erik Blasch; Matthew Cherry; Sean M. O'Rourke; Laura Homa (DDDAS/Infosymbiotics, 2024)

Physics Informed Neural Networks for Electrical Impedance Tomography. - Danny Smyl; Tyler N. Tallman; Laura Homa; Chenoa Flournoy; Sarah J. Hamilton; John Wertz (Neural Networks, 2025)