Algorithms for a fast confocal optical inspection system. - A. Ravishankar Rao; Nagarajan Ramesh; Frederick Y. Wu; Jon R. Mandeville; Pieter J. M. Kerstens (WACV, 1992)

Image registration for automated inspection of printed circuit patterns using CAD reference data. - Arturo A. Rodriguez; Jon R. Mandeville (Mach. Vis. Appl., 1993)