A Totally Universal Reset, Initialization (and) Nodal Observation Circuit. - Jon Turino (ITC, 1984)

IEEE P1149 Proposed Standard Testability Bus - An update with case histories. - Jon Turino (ICCD, 1988)

DFT: Profit or Loss – A Position Paper. - Jon Turino (ITC, 1993)

Test Economics in the 21st Century. - Jon Turino (IEEE Des. Test Comput., 1997)

Design for test and time to market-friends or foes. - Jon Turino (ITC, 1999)

Design for Test and Time to Market: A Personal Perspective. - Jon Turino (IEEE Des. Test Comput., 1999)

DFT and BIST techniques for the future. - Hsin-Po Wang 002; Jon Turino (Asian Test Symposium, 2000)