Direct E-Field Measurement and Imaging of Oscillations Within Power Amplifiers. - Jonas Urbonas; Kevin Kim; Peter H. Aaen (IEEE Trans. Instrum. Meas., 2019)

Characterizing S-Parameters of Microwave Coaxial Devices With up to Four Ports at Temperatures of 3 K and Above for Quantum Computing Applications. - Manoj Stanley; Martin J. Salter; Jonas Urbonas; James Skinner; Sang-Hee Shin; Sebastian De Graaf; Nick M. Ridler (IEEE Trans. Instrum. Meas., 2024)