Performance-optimized gate-first 22-nm SOI technology with embedded DRAM. - Gregory Freeman; Paul Chang; E. R. Engbrecht; K. J. Giewont; David F. Hilscher; M. Lagus; Timothy J. McArdle; B. Morgenfeld; Shreesh Narasimha; James P. Norum; K. A. Nummy; Paul C. Parries; et al. (IBM J. Res. Dev., 2015)

Continuous prediction of manufacturing performance throughout the production lifecycle. - Sholom M. Weiss; Amit Dhurandhar; Robert J. Baseman; Brian F. White; Ronald Logan; Jonathan K. Winslow; Daniel J. Poindexter (J. Intell. Manuf., 2016)