Detecting Delay Flaws by Very-Low-Voltage Testing. - Jonathan T.-Y. Chang; Edward J. McCluskey (ITC, 1996)

Quantitative analysis of very-low-voltage testing. - Jonathan T.-Y. Chang; Edward J. McCluskey (VTS, 1996)

SHOrt voltage elevation (SHOVE) test for weak CMOS ICs. - Jonathan T.-Y. Chang; Edward J. McCluskey (VTS, 1997)

Detecting resistive shorts for CMOS domino circuits. - Jonathan T.-Y. Chang; Edward J. McCluskey (ITC, 1998)

Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. - Jonathan T.-Y. Chang; Chao-Wen Tseng; Chien-Mo James Li; Mike Purtell; Edward J. McCluskey (ITC, 1998)

Experimental Results for IDDQ and VLV Testing. - Jonathan T.-Y. Chang; Chao-Wen Tseng; Yi-Chin Chu; Sanjay Wattal; Mike Purtell; Edward J. McCluskey (VTS, 1998)