Eliminating the Ouija board: automatic thresholds and probabilistic I_DDQ diagnosis. - David B. Lavo; Tracy Larrabee; Jonathon E. Colburn (ITC, 1999)

Determining Redundancy Requirements for Memory Arrays with Critical Area Analysis. - Julie D. Segal; Sergei Bakarian; Jonathon E. Colburn; Madan Kumar; Chang Hong; Alex Shubat (MTDT, 1999)

Optimizing Memory Tests by Analyzing Defect Coverage. - Alvin Jee; Jonathon E. Colburn; V. Swamy Irrinki; Mukesh Puri (MTDT, 2000)

Hybrid selector for high-X scan compression. - Peter Wohl; John A. Waicukauski; Frederic Neuveux; Jonathon E. Colburn (ITC, 2012)

Enhancing testability by structured partial scan. - Peter Wohl; John A. Waicukauski; Jonathon E. Colburn (VTS, 2012)

Two-level compression through selective reseeding. - Peter Wohl; John A. Waicukauski; Frederic Neuveux; Gregory A. Maston; Nadir Achouri; Jonathon E. Colburn (ITC, 2013)

Innovative practices session 6C: Latest practices in test compression. - Jonathon E. Colburn; Kun Young Chung; Haluk Konuk; Y. Dong (VTS, 2013)

Innovative practices session 10C: Delay test. - P. Pant; M. Amodeo; Sujal Vora; Jonathon E. Colburn (VTS, 2013)

Achieving extreme scan compression for SoC Designs. - Peter Wohl; John A. Waicukauski; Jonathon E. Colburn; Milind Sonawane (ITC, 2014)

Flexible scan interface architecture for complex SoCs. - Milind Sonawane; Sailendra Chadalavada; Shantanu Sarangi; Amit Sanghani; Mahmut Yilmaz; Pavan Kumar Datla Jagannadha; Jonathon E. Colburn (VTS, 2016)

Dynamic docking architecture for concurrent testing and peak power reduction. - Milind Sonawane; Pavan Kumar Datla Jagannadha; Sailendra Chadalavada; Shantanu Sarangi; Mahmut Yilmaz; Amit Sanghani; Karthikeyan Natarajan; Jonathon E. Colburn; Anubhav Sinha (VTS, 2016)

Test-cost optimization in a scan-compression architecture using support-vector regression. - Zipeng Li; Jonathon E. Colburn; Vinod Pagalone; Kaushik Narayanun; Krishnendu Chakrabarty (VTS, 2017)

XLBIST: X-Tolerant Logic BIST. - Peter Wohl; John A. Waicukauski; Gregory A. Maston; Jonathon E. Colburn (ITC, 2018)

An Efficient Supervised Learning Method to Predict Power Supply Noise During At-speed Test. - Seyed Nima Mozaffari; Bonita Bhaskaran; Kaushik Narayanun; Ayub Abdollahian; Vinod Pagalone; Shantanu Sarangi; Jonathon E. Colburn (ITC, 2019)